Oxford Instruments X‑MET5100 is a rugged handheld XRF analyzer that leverages a Silicon Drift Detector (SDD) and powerful 45 kV X‑ray tube to deliver ultra-fast, lab‑quality analysis—including challenging light elements like Mg, Al, and Si—without requiring vacuum or helium. It delivers results in seconds down to ppm levels, ideal for alloy verification, scrap sorting, PMI, mining, and environmental screening.